Auf der Seite der “Interface Physics Group” der Westfälische Wilhelms-Universität Münster findet sich eine Bauanleitung für ein RasteTunnelMikroskop (die für das RasterKraftMikroskop ist noch in Arbeit).

X-ray Photoelectron Spectroscopy (XPS) - a powerful tool for surface analysis.

Today I have received an email from the Conference Office of the Scanning Probe Microscopy Conference which will be held in Beijing - TEDA, China from May 23 to 27, 2004.
The SPM 2004 is an international conference including applications and developments in scanning probe microscopy, sensors based on cantilever technology and structures at the microscopic […]

Characterization of thin Pd films grown on noble metal substrates by AFM and XPS S.S. Maluf, A.L. Gobbi, P.I. Paulin-Filho, P.A.P. Nascente Presented at Congreso Latinoamericano de Ciencias de Superficies y sus Aplicaciones (CLACSA 2003), Pucón, Chile, 7-12, Diciembre 2003