SPM, Sensors and Nanostructures in Beijing 2004

Today I have received an email from the Conference Office of the Scanning Probe Microscopy Conference which will be held in Beijing - TEDA, China from May 23 to 27, 2004.

The SPM 2004 is an international conference including applications and developments in scanning probe microscopy, sensors based on cantilever technology and structures at the microscopic scale.

further information available at SPM 2004 Site

This entry was posted on Donnerstag, Dezember 11th, 2003 at 10:33 am and is filed under STM images, Surface Analysis. You can follow any responses to this entry through the RSS 2.0 feed. You can skip to the end and leave a response. Pinging is currently not allowed.